Temperature dependency of MOSFET device characteristics in 4H- and 6H-silicon carbide (SiC)

M. Hasanuzzaman(The Abdus Salam International Centre for Theoretical Physics (ICTP)), Mohammad Tawhidul Alam(University of Tennessee at Knoxville), Leon M. Tolbert(Knoxville College), Syed K. Islam(Oak Ridge National Laboratory)
Solid-State Electronics
June 22, 2004
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