Measuring elastoplastic properties of thin films on an elastic substrate using sharp indentation
Manhong Zhao(Columbia University), Yong X. Gan(National Natural Science Foundation of China), Dongyun Lee(Korea Institute of Science and Technology), Xi Chen(Beijing Jiaotong University), Norimasa Chiba(National Defense Academy of Japan), Joost J. Vlassak(Harvard University), Nagahisa OGASAWARA(National Defense Academy of Japan), Yong Xiang(University of Electronic Science and Technology of China)
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