Tackling the widespread and critical impact of batch effects in high-throughput data
Jeffrey T. Leek(Johns Hopkins University), Robert B. Scharpf(Johns Hopkins University), Héctor Corrada Bravo(Johns Hopkins University), David Simcha(Johns Hopkins University), Ben Langmead(Johns Hopkins University), W. Evan Johnson(Brigham Young University), Donald Geman(Johns Hopkins University), Keith Baggerly(The University of Texas MD Anderson Cancer Center), Rafael A. Irizarry(Johns Hopkins University)
Cited by 2,262Open Access
Abstract
Related Papers
No related papers found
Powered by citation graph analysis