Test connections - tying application to process
John M. Carulli(Texas Instruments (United States)), T. J. Anderson(Texas Instruments (United States))
Cited by 20
Abstract
The ability to meet ever more demanding customer quality and reliability requirements is becoming increasingly difficult with each advancing technology generation. This issue becomes more complex as customer applications and requirements become more varied for the same basic technology. The customer applications range from cell phones and PDAs to servers to automotive. The reliability requirement descriptions vary from hundreds of defective parts per million (DPPM) to five nines availability to a zero defects culture. This paper focus on how customer quality and reliability expectations are influencing the perception and direction of test
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