Degradation processes at the cathode/organic interface in organic light emitting devices with Mg:Ag cathodes

Hany Aziz(McMaster University), Zoran D. Popović(Xerox (Canada)), Carl P. Tripp(Xerox (Canada)), Nan‐Xing Hu(Xerox (Canada)), Ah‐Mee Hor(Xerox (Canada)), Gu Xu(McMaster University)
Applied Physics Letters
May 25, 1998
Cited by 198

Abstract

We report electroluminescence degradation studies on tris(8-hydroxyquinoline) aluminum (Alq3)-based organic light emitting devices (OLEDs) with Mg:Ag cathodes in ambient conditions. The nonemissive spots in the OLEDs are studied via optical and fluorescence microscopy and via microscopic infrared spectroscopy. Studies reveal that a majority of the nonemissive spots are caused by the growth of Mg(OH)2 sites at the Alq3/Mg:Ag interface, associated with local degradation of the Alq3 layer. In addition, the growth of elevated cathode bubbles, which also lead to nonemissive spots, is found to be caused by gas evolution from the galvanic corrosion of the Mg/Ag couple as well as from the electrolysis of absorbed moisture.


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