<title>Structural characterization of chalcogenide planar waveguide materials using near-infrared Raman spectroscopy</title>

Kathleen Richardson(Columbia University), A. Villeneuve(Royal Society of Canada), Mathieu Marchivie(Centre National de la Recherche Scientifique), Thierry Cardinal(Université de Bordeaux), Karine Le Foulgoc(Université Laval), Kevin Zollinger(University of Central Florida), Jennifer K. Evans(University of Central Florida), Alfons Schulte(University of Central Florida), Tigran Galstian(Université Laval), A. Saliminia(Université Laval)
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
December 10, 1999
Cited by 3


Related Papers