<i>In-situ</i> X-ray diffraction combined with scanning AC nanocalorimetry applied to a Fe0.84Ni0.16 thin-film sample
John M. Gregoire(California Institute of Technology), Joost J. Vlassak(Harvard University), Darren Dale(Cornell University), Kechao Xiao(Harvard University), Gayatri Cuddalorepatta(Harvard University), Patrick J. McCluskey(Harvard University)
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