<i>In-situ</i> X-ray diffraction combined with scanning AC nanocalorimetry applied to a Fe0.84Ni0.16 thin-film sample

John M. Gregoire(California Institute of Technology), Joost J. Vlassak(Harvard University), Darren Dale(Cornell University), Kechao Xiao(Harvard University), Gayatri Cuddalorepatta(Harvard University), Patrick J. McCluskey(Harvard University)
Applied Physics Letters
May 20, 2013
Cited by 36


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