Critical currents in submicron YBa/sub 2/Cu/sub 3/O/sub 7/ lines
H.P. Assink(Delft University of Technology), J. E. Mooij(Delft University of Technology), N.Y. Chen(Delft University of Technology), P. Hadley(Delft University of Technology), C.M. Schep(Delft University of Technology), A.J.M. van der Harg(Delft University of Technology), D. van der Marel(University of Geneva), E. W. J. M. van der Drift(Delft University of Technology)
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