Gate All Around MOSFET With Vacuum Gate Dielectric for Improved Hot Carrier Reliability and RF Performance

Rajni Gautam(University of Delhi), Mridula Gupta(University of Delhi), Manoj Saxena(University of Delhi), Radhey S. Gupta(Maharaja Engineering College)
IEEE Transactions on Electron Devices
April 29, 2013
Cited by 55


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