Experimental confirmation of temperature dependent negative capacitance in ferroelectric field effect transistor

Giovanni A. Salvatore(École Polytechnique Fédérale de Lausanne), Adrian M. Ionescu(NanoLab (United States)), Alexandru Rusu(École Polytechnique Fédérale de Lausanne)
Applied Physics Letters
April 16, 2012
10.1063/1.4704179
Cited by 98

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