Identification of yellow rust in wheat using in-situ spectral reflectance measurements and airborne hyperspectral imaging
Wenjiang Huang(Chinese Academy of Sciences), Jihua Wang(Chinese Academy of Sciences), Yongjiang Zhang(Chinese Academy of Sciences), David Lamb(Analog Devices (United States)), Liangyun Liu(Chinese Academy of Sciences), Zheng Niu(National Engineering Research Center for Information Technology in Agriculture)
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