Melting curve of silicon to 15GPa determined by two-dimensional angle-dispersive diffraction using a Kawai-type apparatus with X-ray transparent sintered diamond anvils
Atsushi Kubo(Princeton University), T. S. Duffy(Princeton University), Claire E. Runge(Princeton University), Boris Kiefer(New Mexico State University), Yanbin Wang(Harbin Engineering University), Takeyuki Uchida(Los Alamos National Laboratory), Norimasa Nishiyama(Lyon 1 Université)
Cited by 52
Related Papers
Nanotwinned diamond with unprecedented hardness and stability
|Nature|2014|876
Ultrahard nanotwinned cubic boron nitride
|Nature|2013|819
Graphene Oxide‐Based Electrode Inks for 3D‐Printed Lithium‐Ion Batteries
|Advanced Materials|2016|751
Seismic velocities in mantle minerals and the mineralogy of the upper mantle
|Journal of Geophysical Research Atmospheres|1989|609
Covalency-reinforced oxygen evolution reaction catalyst
|Nature Communications|2015|542