Correlation of in-situ reflectance spectra and resistivity of GaN/Al2O3 interfacial layer in metalorganic chemical vapor deposition
Yugang Zhou(Hong Kong University of Science and Technology), Kei May Lau(Hong Kong University of Science and Technology), Chak Wah Tang(Hong Kong University of Science and Technology), Zhengdong Lu(Hong Kong University of Science and Technology), Kevin J. Chen(Hong Kong University of Science and Technology), Deliang Wang(Shenzhen University), Yundong Qi(Hong Kong University of Science and Technology), Rongming Chu(Hong Kong University of Science and Technology)
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