Atom-resolved imaging of ordered defect superstructures at individual grain boundaries
Zhongchang Wang(Huaiyin Normal University), Yuichi Ikuhara(Institute of Engineering), Mitsuhiro Saito(Tohoku University), Susumu Tsukimoto(Tohoku University), Alexander L. Shluger(University College London), Keith P. McKenna(University of York), Lin Gu(Tsinghua University)
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