Atom-resolved imaging of ordered defect superstructures at individual grain boundaries
Zhongchang Wang(Tohoku University), Yuichi Ikuhara(Institute of Engineering), Mitsuhiro Saito(Tohoku University), Susumu Tsukimoto(Tohoku University), Alexander L. Shluger(London Centre for Nanotechnology), Keith P. McKenna(University of York), Lin Gu(Chinese Academy of Sciences)
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