Monitoring and characterization of resistance development of strawberry Phomopsis leaf blight to fungicides

Haojie Shi(University of Science and Technology of China), Xin Shen(Zhejiang A & F University), Chuanqing Zhang(Zhejiang A & F University), Huiming Wu(ON Semiconductor (United States))
European Journal of Plant Pathology
October 11, 2012
Cited by 15


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