Simultaneous measurement of thermal conductivity and heat capacity of bulk and thin film materials using frequency-dependent transient thermoreflectance method

Jùn Líu(University of Colorado Boulder), Ronggui Yang(University of Colorado Boulder), Xiaokun Gu(University of Colorado Boulder), Aaron J. Schmidt(Boston University), Miao Tian(Tianjin University), Jie Zhu(Chinese Academy of Sciences)
Review of Scientific Instruments
March 1, 2013
Cited by 156


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