An ultra-sensitive resistive pressure sensor based on hollow-sphere microstructure induced elasticity in conducting polymer film

Lijia Pan(Nanjing University), Alex Chortos(Stanford University), Guihua Yu(The University of Texas at Austin), Yaqun Wang(Nanjing University), Scott G. Isaacson(Stanford University), Ranulfo Allen(Stanford University), Yi Shi(Nanjing University), Reinhold H. Dauskardt(Stanford University), Zhenan Bao(Stanford University)
Nature Communications
January 6, 2014
10.1038/ncomms4002
Cited by 1,493Open Access
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