AFM–IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization

Alexandre Dazzi(Université Paris-Sud), Curtis Marcott(Unknown), D. Bruce Chase(Biotechnology Institute), Craig Prater(Unknown), Qichi Hu(Bruker (United States)), John F. Rabolt(University of Delaware)
Applied Spectroscopy
December 1, 2012
Cited by 534


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