Reparative effect of diffusion process on host defects in Cr2+ doped ZnS/ZnSe
Min Chen(University of Science and Technology of China), Benxue Jiang(Chinese Academy of Sciences), Hongmei Cui(China National Building Materials Group (China)), Jiang Li(China Academy of Building Research), Huamin Kou(Chinese Academy of Sciences), Yubai Pan(Chinese Academy of Sciences), Wei Li(Wuhan National Laboratory for Optoelectronics)
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