Lattice deformation in laser-shocked silicon single crystal studied by using picosecond time-resolved X-ray diffraction with laser plasma X-rays
Kazutaka G. Nakamura(Tokyo Institute of Technology), Ken‐ichi Kondo(Tokyo Institute of Technology), Yoichiro Hironaka(Institute for Laser Technology), Toshiyuki Atou(Tokyo Institute of Technology), Yutaro Okano(Tokyo Institute of Technology), Hiroto Morishita(Tokyo Institute of Technology), Hiroaki Kishimura(Tokyo Institute of Technology)
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