Contribution to size effect of yield strength from the stochastics of dislocation source lengths in finite samples
Triplicane A. Parthasarathy(UES (United States)), Dallas R. Trinkle(University of Illinois Urbana-Champaign), S.I. Rao(UES (United States)), Dennis M. Dimiduk(Pioneer (United States)), Michael D. Uchic(United States Air Force Research Laboratory)
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