Contribution to size effect of yield strength from the stochastics of dislocation source lengths in finite samples
Triplicane A. Parthasarathy(UES (United States)), Dallas R. Trinkle(The Ohio State University), S.I. Rao(UES (United States)), Dennis M. Dimiduk(Lawrence Livermore National Laboratory), Michael D. Uchic(United States Air Force Research Laboratory)
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