Towards 100% In-situ 2D/3D Quality Inspection of Metallic Micro Components Using Plenoptic Cameras
D. R. Weimer(Virginia Tech), Bernd Scholz‐Reiter(University of Bremen), Carolin Fellmann(University of Bremen), Michael Lütjen(University of Bremen), Klaus‐Dieter Thoben(University of Bremen), Hendrik Thamer(University of Bremen)
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