AFM Characterization of Copper Dendritic Growths in Integrated Electronic Microcircuits

C. Gabrielli(Centre National de la Recherche Scientifique), Alain Pailleret(Centre National de la Recherche Scientifique), Charles R. Mace(Tufts University), E. Ostermann(Centre National de la Recherche Scientifique)
Electrochemical and Solid-State Letters
November 14, 2007
Cited by 3


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