Picosecond structural dynamics in photoexcited Si probed by time-resolved x-ray diffraction
Hiroaki Kishimura(Tokyo Institute of Technology), Ken‐ichi Kondo(Tokyo Institute of Technology), Kazutaka G. Nakamura(Tokyo Institute of Technology), Yoichiro Hironaka(Institute for Laser Technology), Hidetaka Kawano(Tokyo Institute of Technology), Akio Yazaki(Tokyo Institute of Technology)
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