Atomic force microscopy on homoepitaxial SrTiO3 films grown under monitoring of intensity oscillation in reflection high energy electron diffraction
Mamoru Yoshimoto(Tokyo Institute of Technology), K. Hirai(Kanagawa Academy of Science and Technology), Masao Kumagai(Kanagawa Academy of Science and Technology), Hideomi Koinuma(Cabinet Office), K. Horiguchi(Yamagata University), H. Ohkubo(Tokyo Institute of Technology), Naoki Kanda(Jichi Medical University)
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