Photoemission and glancing-angle extended x-ray absorption fine-structure studies of vacuum-deposited Al/Cu bilayers

D. Di Marzio(Brookhaven National Laboratory), Steve M. Heald(Argonne National Laboratory), H. Chen(Brookhaven National Laboratory), M. W. Ruckman(Brookhaven National Laboratory)

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

May 1, 1989

10.1116/1.576090

Cited by 7

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