Hall effect-induced acceleration of electromigration failures in spin valve multilayers under magnetic field

Jing Jiang(University of Electronic Science and Technology of China), Seongtae Bae(University of Minnesota), D. Zeng(National University of Singapore), Jongryoul Kim(Hanyang University), Kyung-Won Chung
Applied Physics Letters
April 18, 2011
Cited by 3


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