Environmental degradation properties of YBa2Cu3O7−δ and Y0.6Ca0.4Ba1.6La0.4Cu3O7−δ thin film structures
Ji-Ping Zhou(The University of Texas at Austin), John T. McDevitt(New York University), M. Arendt(The University of Texas at Austin), Jeff Armstrong(Rutherford Appleton Laboratory), J. Talvacchio(Northrop Grumman (United States)), Rung-Kuang Lo(The University of Texas at Austin), Steven M. Savoy(The University of Texas at Austin), Du-Yu Yang(The University of Texas at Austin)
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