Measuring Thermal and Thermoelectric Properties of One-Dimensional Nanostructures Using a Microfabricated Device

Li Shi(The University of Texas at Austin), Deyu Li(University of California, Berkeley), Choongho Yu(The University of Texas at Austin), Wanyoung Jang(University of California, Berkeley), Dohyung Kim(The University of Texas at Austin), Zhen Yao(University of California, Berkeley), Philip Kim(Columbia University), Arun Majumdar(Lawrence Berkeley National Laboratory)
Journal of Heat Transfer
September 23, 2003
10.1115/1.1597619
Cited by 731

Abstract

We have batch-fabricated a microdevice consisting of two adjacent symmetric silicon nitride membranes suspended by long silicon nitride beams for measuring thermophysical properties of one-dimensional nanostructures (nanotubes, nanowires, and nanobelts) bridging the two membranes. A platinum resistance heater/thermometer is fabricated on each membrane. One membrane can be Joule heated to cause heat conduction through the sample to the other membrane. Thermal conductance, electrical conductance, and Seebeck coefficient can be measured using this microdevice in the temperature range of 4–400 K of an evacuated Helium cryostat. Measurement sensitivity, errors, and uncertainty are discussed. Measurement results of a 148 nm and a 10 nm-diameter single wall carbon nanotube bundle are presented.

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