Thin Film Materials Characterization Using TE Modes Cavity
Jean-Michel Le Floch(Centre National de la Recherche Scientifique), Wei Peng(Shenzhen University), Valérie Madrangeas(Centre National de la Recherche Scientifique), D. Cros(Centre National de la Recherche Scientifique), Maryline Guilloux‐Viry(Centre National de la Recherche Scientifique), F. Houndonougbo(Centre National de la Recherche Scientifique)
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