Lateral Resolution Enhancement of Vertical Scanning Interferometry by Sub-Pixel Sampling

Rolf S. Arvidson(University of Bremen), Andreas Lüttge(Planetary Science Institute), Douglas Natelson(Northwestern University), Gavin D. Scott(Rice University), Cornelius Fischer(University of Göttingen), Dale S. Sawyer(Planetary Science Institute)
Microscopy and Microanalysis
January 7, 2014
Cited by 19


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