Stability and charge transfer levels of extrinsic defects in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mtext>LiNbO</mml:mtext></mml:mrow><mml:mn>3</mml:mn></mml:msub></mml:mrow></mml:math>
Haixuan Xu(University of Florida), Simon R. Phillpot(University of Florida), Volkmar Dierolf(Lehigh University), Venkatraman Gopalan(Pennsylvania State University), Susan B. Sinnott(Pennsylvania State University), Aleksandr Chernatynskiy(Missouri University of Science and Technology), Donghwa Lee(University of Florida)
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