Effect of variations in terminal contact resistances on the current distribution in high-temperature superconducting cables
Gerard Willering(European Organization for Nuclear Research), Y. Viouchkov(Florida State University), D C van der Laan(University of Colorado Boulder), H.W. Weijers(Florida State University), P. D. Noyes(National High Magnetic Field Laboratory), George E. Miller(National High Magnetic Field Laboratory)
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