High-resolution transmission electron microscopy study of the radiation damage defects in high temperature superconductors
Yuanyuan Zhao(Dalian University of Technology), Yuankai K. Tao(Massachusetts Institute of Technology), W. K. Chu(University of Houston), H.W. Zandbergen(Delft University of Technology), J. Kulik(University of Houston), J. R. Liu(University of Houston)
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