Investigation on the electric-field-induced Pockels effect and optical rectification in near-intrinsic silicon samples
Jingcheng Zhu(University of Wisconsin–Madison), Gang Jia(China Electronics Technology Group Corporation), Zhenyu Wang(Jilin University), Wei Han(Thermal Power Research Institute), Yanjun Gao(Jilin University), Zhanguo Chen, Jinbo Mu(Jilin University), Xiuhuan Liu(Jilin University)
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