Defects in ZnO Nanorods Prepared by a Hydrothermal Method

K. H. Tam(Hong Kong University of Science and Technology), C. K. Cheung(Hong Kong University of Science and Technology), Y. H. Leung(University of Hong Kong), Aleksandra B. Djurišić(University of Hong Kong), C. C. Ling(Hong Kong University of Science and Technology), C. D. Beling(University of Hong Kong), S. Fung(University of Hong Kong), Wai‐Ming Kwok(Hong Kong University of Science and Technology), Ying N. Chan(Hong Kong University of Science and Technology), David Lee Phillips(University of Hong Kong), Lan Ding(Hong Kong University of Science and Technology), Weikun Ge(Hong Kong University of Science and Technology)
The Journal of Physical Chemistry B
September 20, 2006
10.1021/jp063239w
Cited by 758

Abstract

ZnO nanorod arrays were fabricated using a hydrothermal method. The nanorods were studied by scanning electron microscopy, photoluminescence (PL), time-resolved PL, X-ray photoelectron spectroscopy, and positron annihilation spectroscopy before and after annealing in different environments and at different temperatures. Annealing atmosphere and temperature had significant effects on the PL spectrum, while in all cases the positron diffusion length and PL decay times were increased. We found that, while the defect emission can be significantly reduced by annealing at 200 degrees C, the rods still have large defect concentrations as confirmed by their low positron diffusion length and short PL decay time constants.

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