Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudesElisabeth Wutscher(University of Regensburg), Franz J. Gießibl(University of Regensburg)Review of Scientific InstrumentsSeptember 1, 201110.1063/1.3633950Cited by 41SaveCiteExport RISWatch citationsRelated PapersComparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators|Physical Review B|2011|112