Measurement of the A1Π−X1σ+ electronic transition moment of SiO using a shock tube
Chung S. Park(SRI International), Karen R. Heere(Science Applications International Corporation (United States)), David R. Crosley(SRI International), D. J. Eckstrom(SRI International)
Journal of Quantitative Spectroscopy and Radiative Transfer
April 1, 1993
Cited by 11
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