Linewidth dependence of critical current density in Y1Ba2Cu3O7 thin-film microbridges
Yuanyuan Zhao(Dalian University of Technology), Demetre J. Economou(University of Houston), D. K. Christen(Oak Ridge National Laboratory), Shashank C. Deshmukh(University of Houston), W. K. Chu(University of Houston), J. C. Wolfe(University of Houston), M.F. Davis(University of Houston), Edwin Jones(Oak Ridge National Laboratory)
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