Electronic structure of single-crystalline<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mi mathvariant="normal">NdO</mml:mi><mml:mrow><mml:mn>0.5</mml:mn></mml:mrow></mml:msub><mml:msub><mml:mi mathvariant="normal">F</mml:mi><mml:mrow><mml:mn>0.5</mml:mn></mml:mrow></mml:msub><mml:msub><mml:mi mathvariant="normal">BiS</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:math>studied by angle-resolved photoemission spectroscopy
Z. R. Ye(Fudan University), M. H. Jiang(Chinese Academy of Sciences), Donglai Feng(University of Science and Technology of China), Jian Jiang(Fudan University), Xiangang Wan(Collaborative Innovation Center of Advanced Microstructures), J. Z. Liu(Collaborative Innovation Center of Advanced Microstructures), X. H. Niu(Fudan University), Xiyu Zhu(Collaborative Innovation Center of Advanced Microstructures), Yongping Du(Collaborative Innovation Center of Advanced Microstructures), H. F. Yang(Chinese Academy of Sciences), Hai‐Hu Wen(Collaborative Innovation Center of Advanced Microstructures), Dawei Shen(University of Science and Technology of China)
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