Quantitative Interfacial Energy Measurements of Adhesion-Promoted Thin Copper Films by Supercritical Fluid Deposition on Barrier Layers

Christos F. Karanikas(University of Massachusetts Amherst), James J. Watkins(University of Massachusetts Amherst), Joost J. Vlassak(Harvard University), Han Li(Guangzhou University)
Journal of Engineering Materials and Technology
February 22, 2010
Cited by 9


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