Electronic bonding transition in compressed<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mi>SiO</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math>glass

Jung‐Fu Lin(The University of Texas at Austin), Paul Chow(Argonne National Laboratory), Hiroshi Fukui(Okayama University), Andrea Trave(Lawrence Livermore National Laboratory), Michael Y. Hu(Kent State University), Yong Q. Cai(Dalian Institute of Chemical Physics), Peter J. Eng(Centre National de la Recherche Scientifique), David Prendergast(Lawrence Berkeley National Laboratory), Takuo Okuchi(Kyoto University), Choong-Shik Yoo(Lawrence Livermore National Laboratory), Nozomu Hiraoka(National Synchrotron Radiation Research Center)
Physical Review B
January 5, 2007
Cited by 97


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