Defect structure originating from threading dislocations within the GaN film grown on a convex patterned sapphire substrate
Tae Su Oh(Jeonbuk National University), Eun-Kyung Suh(Jeonbuk National University), Mun Seok Jeong(Hanyang University), Kang Jea Lee(Jeonbuk National University), Tae Hoon Seo(Korea Institute of Science and Technology), Hyun Jeong(Gwangju Institute of Science and Technology), Hun Kim(Jeonbuk National University), Yong Seok Lee(Jeonbuk National University), Ah Hyun Park(Jeonbuk National University)
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