Investigation of the influence of duty cycle on the vanadium oxide thin film thermistor deposited by pulsed dc reactvie magnetron sputtering

Xiang Dong(University of Electronic Science and Technology of China), Yadong Jiang(University of Electronic Science and Technology of China), Deen Gu(University of Electronic Science and Technology of China), Tao Wang(Tiangong University), Xiongbang Wei(University of Electronic Science and Technology of China), He Yu(University of Electronic Science and Technology of China), Xiangdong Xu(University of Electronic Science and Technology of China), Zhiming Wu(University of Electronic Science and Technology of China)
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June 1, 2014
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