Scanning AC nanocalorimetry combined with <i>in-situ</i> x-ray diffraction

Kechao Xiao(Harvard University), Joost J. Vlassak(Harvard University), Darren Dale(Cornell University), John M. Gregoire(California Institute of Technology), Patrick J. McCluskey(Harvard University)
Journal of Applied Physics
June 24, 2013
Cited by 41


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