Variable temperature film and contact resistance measurements on operating <i>n</i>-channel organic thin film transistors

Reid J. Chesterfield(University of Minnesota), Larry L. Miller(University of Minnesota), Paul C. Ewbank(University of Minnesota), C. Daniel Frisbie(University of Minnesota), John C. McKeen(University of Minnesota), Christopher R. Newman(University of Minnesota), Kent R. Mann(California Institute of Technology)
Journal of Applied Physics
May 17, 2004
Cited by 191


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