Variable temperature film and contact resistance measurements on operating <i>n</i>-channel organic thin film transistors
Reid J. Chesterfield(University of Minnesota), Larry L. Miller(University of Minnesota), Paul C. Ewbank(University of Minnesota), C. Daniel Frisbie(University of Minnesota), John C. McKeen(University of Minnesota), Christopher R. Newman(University of Minnesota), Kent R. Mann(California Institute of Technology)
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