Error compensation for CMM touch trigger probes

William T. Estler(National Institute of Standards and Technology), Steven Phillips(National Institute of Standards and Technology), Bruce R. Borchardt(National Institute of Standards and Technology), Theodore H Hopp(National Institute of Standards and Technology), Christoph Witzgall(National Institute of Standards and Technology), Mark Levenson(National Institute of Standards and Technology), Keith R. Eberhardt(National Institute of Standards and Technology), Marjorie A. McClain(National Institute of Standards and Technology), Yuan Shen(George Washington University), X. Zhang(George Washington University)
Precision Engineering
October 1, 1996
10.1016/s0141-6359(96)00040-2
Cited by 85

Abstract

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