Phase resolved near-field mode imaging for the design of frequency-selective surfaces
Edward C. Kinzel(University of North Carolina at Charlotte), Glenn D. Boreman(University of North Carolina at Charlotte), Robert L. Olmon(National Institute of Standards and Technology), Igal Brener(Sandia National Laboratories), Markus B. Raschke(Environmental Molecular Sciences Laboratory), James C. Ginn(Plasmonics (United States)), Michael B. Sinclair(Sandia National Laboratories California), Brian A. Lail
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