Hall effect measurements on epitaxial SmNiO<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:msub><mml:mrow/><mml:mn>3</mml:mn></mml:msub></mml:math>thin films and implications for antiferromagnetism

Sieu D. Ha(Harvard University), Shriram Ramanathan(Rutgers, The State University of New Jersey), J. D. Baniecki(Fujitsu (Japan)), D. M. Silevitch(California Institute of Technology), R. Jaramillo(Harvard University), Frank Schoofs(Harvard University), Kian Kerman(Interface (United States))
Physical Review B
March 29, 2013
Cited by 61


Related Papers