Investigation of thermoelectric silicide thin films by means of analytical transmission electron microscopy
D. Hofman(Leibniz Institute for Solid State and Materials Research), K. Wetzig(Leibniz Institute for Solid State and Materials Research), J. Thomas(University of Calicut), Ch. Kleint(Leibniz Institute for Solid State and Materials Research)
Cited by 4
Related Papers
Ion-exchange mediated removal of cationic dye-stuffs from water using ammonium phosphomolybdate
|Materials Chemistry and Physics|2019|287
Improved plasticity of bulk metallic glasses upon cold rolling
|Scripta Materialia|2010|135
Strontium-modified premixed calcium phosphate cements for the therapy of osteoporotic bone defects
|Acta Biomaterialia|2017|135
Low temperature tunneling magnetoresistance on (La,Sr)MnO3∕Co junctions with organic spacer layers
|Journal of Applied Physics|2008|133
Synthesis, characterization and microwave dielectric properties of nanocrystalline CaZrO3 ceramics
|Journal of Alloys and Compounds|2007|106